High Mobility CMOS Technologies using III-V/Ge Channels

نویسندگان

  • Shinichi Takagi
  • Mitsuru Takenaka
چکیده

CMOS utilizing high mobility III-V/Ge channels on Si substrates is expected to be one of promising devices for high performance and low power advanced LSIs in the future under sub 10 nm regime, because of the enhanced carrier transport properties [1-4]. Here, there can be several CMOS structures using III-V/Ge channels, as schematically shown in Fig. 1. While one of the ultimate CMOS structures can be the combination of III-V nMOSFETs and Ge pMOSFETs, viable CMOS structures using III-V and/or Ge channels are still strongly dependent on coming progress in the device/process/ integration technologies of Ge/III-V nand pMOSFETs.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Short Course Emerging Technologies for Post 14nm Cmos

It is well recognized that new device engineering is indispensable in overcoming difficulties of advanced CMOS and realizing high performance LSIs under 10 nm regime. Here, the channel materials with high mobility and, more essentially, low effective mass, are preferable under quasi-ballistic transport expected in ultra-short channel regime. From this viewpoint, Ge and IIIV semiconductor channe...

متن کامل

Challenges & Advances of Mosfets Using High Mobility Material Channels Novel Quantum-corrected Semi-classical Ensemble Monte Carlo Simulator for Nano-scale Iii-v In0.47ga0.53as Tri-gate Finfets Electron Devices & Applications I

Complementary MOSFET (CMOS) using high mobility materials using III-V and Ge channels are expected to be one of promising devices for high performance and low power advanced LSIs in the future under sub-10 nm regime, because of the enhanced carrier conduction properties. The advantages of MOSFETs using those materials can basically originate in the low effective mass, which leads to high inject...

متن کامل

10a.1 Advanced Semiconductor on Insulator Substrates for Low Power and High Performance Digital CMOS Applications

It has become increasingly difficult to scale CMOS transistors beyond 130nm, yet still maintain high drive currents and reduce supply voltage (Vdd). Much attention has been focused on high mobility for boosting performance of the short channel devices. In this paper we will review the latest development in substrate engineering using the Smart Cut technique, new device architecture and challeng...

متن کامل

High Transport Si/SiGe Heterostructures for CMOS Transistors with Orientation and Strain Enhanced Mobility

We have demonstrated high mobility MOS transistors on high quality epitaxial SiGe films selectively grown on Si (100) substrates. The hole mobility enhancement afforded intrinsically by the SiGe channel (60%) is further increased by an optimized Si cap (40%) process, resulting in a combined ∼100% enhancement over Si channels. Surface orientation, channel direction, and uniaxial strain technolog...

متن کامل

4.4 Fabrication of III-V virtual Substrate on 200 mm Silicon for III-V and Si Devices Integration

We present the hetero-epitaxy of III-V materials on 200 mm Silicon wafers by MOCVD. A Ge layer is first grown on the silicon wafer by a two-step process, allowing a lattice matched GaAs layer to be grown on top. Anti-phase boundaries formation are avoided by using a high growth temperature and an arsine partial pressure above 5 mbar during the nucleation of the GaAs layer. The resulting GaAs vi...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2013